To create new and better alternatives we work with
Besides standard computational modeling we use our patented methods
Left: A Raman spectrometer at the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory frequently used in our materials development projects
Right: Structural analysis of nanoparticles: J. Frantti and Y. Fujioka. Method and system for analysing data obtained using scattering measurements from disordered material.
Patent EP 2464962 B1
