Sivusto ei tue käyttämääsi selainta. Suosittelemme selaimen päivittämistä uudempaan versioon.

To create new and better alternatives we work with

 

 

Besides standard computational modeling we use our patented methods

 
Left: A Raman spectrometer at the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory frequently used in our materials development projects

 

Right: Structural analysis of nanoparticles: J. Frantti and Y. Fujioka. Method and system for analysing data obtained using scattering measurements from disordered material.
Patent EP 2464962 B1

 

 

 

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